6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement
in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
half-monolayer high (0.75 nm) steps.
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
monolayer high (1.5 nm) steps.
Test sample for tip's curvature radius estimation:
qualitative - by comparison of AFM scans, taken by different probes;
quantitative - using "blind" tip's estimation (deconvolution) algorithm.
