"Whisker Type" probes

"Whysker-type" AFM cantilevers are being made by growing a long carbin needle at the end of the standard silicon tip. Such "additional" probe may be also inclined under 10 or 20 degrees to a tip (thus directing straight perpendicular to a surface after being placed in a standard probe's holder of most of commercial AFMs)


Noncontact/Semicontact "Whisker Type" probes


"Whisker Type" probes for noncontact/semicontact modes. Standard length of the Whisker for noncontact/semicontact  modes is 1,0±0,2um (other Whisker length can be considered). At customer's requirement tip side of cantilever can be coated by conductive coating.

Contact "Whisker Type" probes


"Whisker Type" probes for contact modes. Standard length of the Whisker for contact modes is 0,4±0,1um (other Whisker length can be considered). At customer's requirement tip side of cantilever can be coated by conductive coating.

Copyright © 2017 - 2024 ScanSens. All rights reserved.