ScanSens supply with high resolution SPM probes for the main SPM modes.
The probes are supplied with and without reflective coating, with conductive and magnetic coatings to cover the greater part of SPM application range.
Extremely sharp tips allow to obtain high-quality images of your samples.
Probes have standard chip size that makes them compartible with the devices of the most SPM manufactures.
AFM probes for Noncontact/Semicontact Modes with wide range of resonant frequencies and force constants.
Can be supplied with Au or Al reflective coating, without tips, bare, with conductive or magnetic coating.
AFM probes for Force Modulation Mode. Can be supplied with Au or Al reflective coating, without tips, bare, with conductive or magnetic coating.
AFM probes for CONTACT modes. Can be supplied with Au or Al reflective coating, without tips, bare, with conductive coating.
AFM probes for Conductive modes (SCM, SKM, SRI, EFM, I-V curve spectroscopy, voltage lithography) with TiN, PtIr or Au conductive coating.
AFM probes for Magnetic mode (MFM) with CoCr magnetic coating.
Noncontact/Semicontact and Contact AFM probes without tips.
Silicon Nitride cantilevers, having low thickness and high Young modulus, combine very low force constant and respectively high resonance frequency. They are traditionally used for imaging biological objects in liquid medium and similar applications, that need using soft cantilevers. Our silicon nitride probes are compatible with most commercial SPM/AFM instruments.